Roughness and Contour Metrology
Waveline measuring systems offer you numerous evaluation options in the field of mobile and stationary surface measurement.

Wide range of roughness measuring devices
Our product range consists of mobile surface measuring instruments, stationary measuring systems for manual and automated roughness, contour, topography or twist measurement, as well as combined systems for roughness and contour measurements. We also offer measuring stations tailored to meeting your specific measuring requirements.

Our measuring systems operate with high precision and reliability in accordance with current standards. They are easy to operate and are ideally suited for daily use on the shop floor and in the metrology lab. Waveline solutions are the result of our years of experience and comprehensive know-how and can be configured for different measuring tasks depending on the requirements.